NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[Si(C₆H₅S)(CH₃)₃]

Name:

trimethyl(phenylthio)silane

CAS Registry No:

4551159

Class:

phenyl benzene, silane

Citation:

Author Name(s):

Pignataro S., Lunazzi L.

Journal:

Tetrahedron Lett. 52, 5341

DOI:

Pub Year:

1972

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

162.00

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):