NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Si(CH₂CHCH₂O)₄

Name:

tetra(2-propene-3-oxo)silane

CAS Registry No:

Class:

oxygen, silane

Citation:

Author Name(s):

Gray R.C., Carver J.C., Hercules D.M.

Journal:

J. Electron Spectrosc. Relat. Phenom. 8, 343

DOI:

Pub Year:

1976

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

102.40

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):