NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[Ni₃S₂(P(C₂H₅)₃)₆](⁺²)

Name:

hexakis(triethylphosphine)dithioatotrinickel ion(+2)

CAS Registry No:

Class:

organometallic, phosphorous, sulfide

Citation:

Author Name(s):

Ghilardi C.A., Midollini S., Orlandini A., Battistoni C., Mattogno G.

Journal:

J. Chem. Soc. Dalton Trans. 939

DOI:

Pub Year:

1984

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

161.30

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):