NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

osmiun

7440-04-2

element

Citation:

Author Name(s):

Siedle A.R., Newmark R.A., Korba G.A., Pignolet L.H., Boyle P.D.

Journal:

Inorg. Chem. 27, 1593

DOI:

Pub Year:

1988

book All Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

51.70

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300