NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

N(C₂H₅)₄[Pt(S₂C₂O₂)₂]

XPS Formula:

N(C₂H₅)₄[Pt*(S₂C₂O₂)₂]

Name:

tetraethylammonium bis(1,2-dithio-oxalato,S,S') platinate(II)

CAS Registry No:

Class:

nitrogen, organometallic, other ring, oxalate, oxygen, sulfur

Citation:

Author Name(s):

Bellitto C., Bonamico M., Fares V., Imperatori P., Patrizio S.

Journal:

J. Chem. Soc. Dalton Trans. 4, 719

DOI:

Pub Year:

1989

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4f_5/2

75.35

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.9

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300