NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[Cu(S₂CN(C₃H₇)₂)₂]ClO₄

XPS Formula:

[Cu(S*₂CN(C₃H₇)₂)₂]ClO₄

Name:

copper(III) bis(diisopropyl dithiocarbamate) perchlorate

CAS Registry No:

Class:

dithoic acid, nitrogen, organometallic, sulfur

Citation:

Author Name(s):

Healy P.C., Myhra S., Stewart A.M.

Journal:

Jpn. J. Appl. Phys. Part 2 26, L1884

DOI:

Pub Year:

1987

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

163.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300