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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
germanium
element, II-VI semiconductor, IV semiconductor, IV-VI semiconductor

Citation:
Taylor J.A., Lancaster G.M., Rabalais, J.W.
J. Electron Spectrosc. Relat. Phenom. 13, 435
Pub Year:
1978

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Conductor
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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