NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[Ni((C₆H₅)₂POCH₃)₄]

Name:

tetrakis(methoxydiphenylphosphine)nickel

CAS Registry No:

Class:

organometallic, oxygen, phenyl benzene, phosphorous

Citation:

Author Name(s):

Tolman C.A., Riggs W.M., Linn W.J., King C.M., Wendt R.C.

Journal:

Inorg. Chem. 12, 2770

DOI:

Pub Year:

1973

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

853.80

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):