NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

(GeSe₂)₆₀(Tl₂Se)₄₀

bridging selenium

germanium thallium selenide ((GeSe2)60(Tl2Se)40)

CAS Registry No:

Class:

chalcogenide, glass, IV-VI semiconductor, selenide

Citation:

Author Name(s):

Sanghera J.S., Heo J., Mackenzie J.D.

Journal:

J. Non-cryst. Solids 101, 8

DOI:

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

54.90

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, C1s=284.44

Charge Reference:

Co-condensed hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Samples were ground into a powder to obtain a fresh surface at the ambient atmosphere and then spread onto an In foil.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300