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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
copper sulfide
chalcogenide, II-VI semiconductor, IV-VI semiconductor, mineral, sulfide

Citation:
Nakai I., Sugitani Y., Nagashima K., Niwa Y.
J. Inorg. Nucl. Chem. 40, 789
Pub Year:
1978

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Two-point correction of energy scale
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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