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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ni
Formula:
NiSi
Name:
nickel silicon imc
CAS Registry No:
Class:
intermetallic, silicide

Citation:
Author Name(s):
Cheung N.W., Grunthaner P.J., Grunthaner F.J., Mayer J.W., Ullrich B.M.
Journal:
J. Vac. Sci. Technol. 18, 917
DOI:
Pub Year:
1981

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
853.50
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ni2p3=852.4
Charge Reference:
Conductor
Energy Scale Evaluation:
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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