There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
copper sulfide
chalcogenide, II-VI semiconductor, IV-VI semiconductor, mineral, sulfide

Citation:
Bhide V.G., Salkalachen S., Rastogi A.C., Rao C.N.R., Hegde M.S.
J. Phys. D. 14, 1647
Pub Year:
1981

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Conductor
Energy Scale Evaluation:
Two-point correction of energy scale
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

An error has occurred. This application may no longer respond until reloaded. Reload 🗙