NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Xe/Ni

Xe*/Ni

xenon on nickel

7440-63-3

element

Citation:

Author Name(s):

Mullins D.R., White J.M., Luftman H.S.

Journal:

Surf. Sci. 167, 39

DOI:

Pub Year:

1986

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

669.40

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

1.2

Calibration:

Ni2p3=852.73

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300