NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C₂H₄/Ru*

ruthenium

7440-18-8

catalyst, element

Citation:

Author Name(s):

Hrbek J.

Journal:

J. Vac. Sci. Technol. A 4, 86

DOI:

Pub Year:

1986

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

280.10

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.1

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, Ru3d = 280.08

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

C2H4/Ru(001) was annealed at 1330 K. Ru was absorbed with C2H4. Formation of graphitic carbon layer with 9x9 LEED pattern.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300