NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[Pd(SCN)₄(P(C₆H₅)₄)₂]

Name:

tetraphenylphosphoniumtetrakis(thiocyanato-S)palladium

CAS Registry No:

82139591

Class:

(iso)thiocyanate, organometallic, phenyl benzene, phosphonium

Citation:

Author Name(s):

Folkesson B., Larsson R.

Journal:

J. Electron Spectrosc. Relat. Phenom. 26, 157

DOI:

Pub Year:

1982

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

337.90

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

IC=285.5

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):