NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[C₆H₅)₄As]₂[Hg(N(CN)₂)₄]

XPS Formula:

[C₆H₅)₄As]₂[Hg(N(CN*)₂)₄]

Name:

bis(tetraphenylarsonium) tetrakis(dicyanamido) mercurate

CAS Registry No:

Class:

(iso)cyanide, mercurate, organometallic, phenyl benzene

Citation:

Author Name(s):

Kohler H., Nefedov V.I., Birkner G., Jeschke M., Kolbe A.

Journal:

Z. Anorg. Allg. Chem. 542, 59

Pub Year:

1986

bookAll Records in this Publication

Data Processing:

Photoelectron Line

398.70

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300