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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
N
Formula:
[C6H5)4As]2[Hg(N(CN)2)4]
XPS Formula:
[C6H5)4As]2[Hg(N(CN*)2)4]
Name:
bis(tetraphenylarsonium) tetrakis(dicyanamido) mercurate
CAS Registry No:
Class:
(iso)cyanide, mercurate, organometallic, phenyl benzene

Citation:
Author Name(s):
Kohler H., Nefedov V.I., Birkner G., Jeschke M., Kolbe A.
Journal:
Z. Anorg. Allg. Chem. 542, 59
Pub Year:
1986

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
398.70
Energy Uncertainty:
0.2
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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