NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

(TiO₂)₅₀(SiO₂)₅₀

(TiO₂)₅₀(Si*O₂)₅₀

titanium(IV) silicon(IV) oxide ((TiO2)50(SiO2)50)

CAS Registry No:

Class:

catalyst, oxide

Citation:

Author Name(s):

Anpo M., Nakaya H., Kodama S., Kubokawa Y., Domen K., and Onishi T.

Journal:

J. Phys. Chem. 90, 1633

DOI:

Pub Year:

1986

bookAll Records in this Publication

Data Processing:

Photoelectron Line

153.60

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Gold

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Ti2p3/2/Si2p intensity ratio is 1.03. The binary oxide catalyst was degassed under vacuum at 777 K, and heated in oxygen at the same temperature.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300