NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Pd₂Si

Name:

palladium silicon imc

CAS Registry No:

Class:

intermetallic, silicide

Citation:

Author Name(s):

Grunthaner P.J., Grunthaner F.J., Madhukar A.

Journal:

J. Vac. Sci. Technol. 20, 680

DOI:

Pub Year:

1982

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

336.80

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ni2p3=852.4,Pt71.3

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):