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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
MoSi2
molybdenum disilicide
12136-78-6
IV-VI semiconductor, silicide

Citation:
Brainard W.A., Wheeler D.R.
J. Vac. Sci. Technol. 15, 1800
Pub Year:
1978

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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