NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Se

InSe

indium selenide

CAS Registry No:

1312421

chalcogenide, II-VI semiconductor, III-V semiconductor, selenide

Citation:

Author Name(s):

Miyake I., Tanpo T., Tatsuyama C.

Jpn. J. Appl. Phys. 23, 172

Pub Year:

1984

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Total Records: 4

Data Processing:

Photoelectron Line

Line Designation:

3d_5/2

Binding Energy (eV)

53.50

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Top of the valence band

Charge Reference:

Conductor

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

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