There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
bismuth
element

Citation:
McGilp J.F., Weightman P., McGuire E.J.
J. Phys. C. 10, 3445
Pub Year:
1977

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Onset of secondary emission
Charge Reference:
Conductor
Energy Scale Evaluation:
Comment:
On = onset of secondary emission

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

An error has occurred. This application may no longer respond until reloaded. Reload 🗙