NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[^-((CH₂)₄^-O)x^-C(O)N(H)^-C₆H₄^-CH₂^-C₆H₄^-N(H)C(O)N(H)^-(CH₂)₂^-N(H)C(O)N(H)^-C₆H₄^-CH₂^-C₆H₄^-N(H)C(O)^-O^-]n

XPS Formula:

nitrogens in urea and urethane segments

Name:

poly(ether urethane urea)

CAS Registry No:

Class:

amide, ether, nitrogen, oxygen, phenyl benzene, polymer, urea

Citation:

Author Name(s):

Marchant R.E., Zhao Q., Anderson J.M., Hiltner A.

Journal:

Polymer 28, 2032

DOI:

Pub Year:

1987

book All Records in this Publication

Data Processing:

Photoelectron Line

397.60

0.2

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

(-((CH2)4-O)x-C(O)N(H)C6H4CH2C6H4N(H)C(O)N(H)(CH2)2N(H)C(O)N(H)C6H4N(H)C(O)O-)

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300