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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Si
Formula:
(-Si(CH3)2-C6H4-Si(CH3)2-O-)x-(Si(CH3)2-O-)y
Name:
poly(tetramethyl-p-silphenylenesiloxane)x-poly(dimethylsiloxane)y
CAS Registry No:
Class:
organometallic, oxygen, phenyl benzene, polymer

Citation:
Author Name(s):
Schmitt R.L., Cardella J.A., Magill J.H., Chin R.L.
Journal:
Polymer 28, 1462
DOI:
Pub Year:
1987

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p, sat
Binding Energy (eV)
108.00
Energy Uncertainty:
0.2
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The single crystal melt. x=80 and y=20 are weight %%. The binding energies of the C1s and O1s lines are the same as for the crystal poly(tetramethyl-p-silphenylenesiloxane).

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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