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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Te
Formula:
Cs/Te
XPS Formula:
Cs/Te
Name:
cesium/tellurium
CAS Registry No:
Class:
alkali, telluride

Citation:
Author Name(s):
Soriano L., Galan L., Rueda F.
Journal:
Surf. Interface Anal. 16, 193
DOI:
Pub Year:
1990

Data Processing:
Data Type:
Auger Parameter
Line Designation:
AP-3d5/2, M4N45N45
Auger Parameter (eV)
1065.01
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Pt FL
Charge Reference:
Cr grid
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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