NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

In

InOx

indium oxides

CAS Registry No:

non-stoichiometric oxide, oxide

Citation:

Author Name(s):

Lin A.W.C., Armstrong N.R., Kuwana T.

Anal. Chem. 49, 1228

Pub Year:

1977

bookAll Records in this Publication

Data Processing:

Auger-Electron Line

Line Designation:

M₄N₄₅N₄₅

Kinetic Energy (eV)

406.30

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

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