NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

tungsten

7440-33-7

element

Citation:

Author Name(s):

Rogers J.D., Sundaram V.S., Kleiman G.G., Castro, C.G.C., Douglas R.A., Peterlevitz A.C.

Journal:

J. Phys. F. 12, 2097

DOI:

Pub Year:

1982

bookAll Records in this Publication

Data Processing:

Auger-Electron Line

M₄N₆₇N₆₇

1791.50

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

AuM477=2099.8

Charge Reference:

Conductor

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):