NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

tin

7440-31-5

element

Citation:

Author Name(s):

Venezia A.M., Cavell R.G.

Journal:

J. Electron Spectrosc. Relat. Phenom. 36, 281

DOI:

Pub Year:

1985

book All Records in this Publication

Data Processing:

Auger-Electron Line

M₅N₄₅N₄₅(¹G)

428.85

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Vacuum Ne1s=870.27 (Ne2s=48.47)

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):