There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
germanium
element, II-VI semiconductor, IV semiconductor, IV-VI semiconductor

Citation:
Shalvoy R.B., Fisher G.B., Stiles P.J.
Phys. Rev. B 15, 1680
Pub Year:
1977

Data Processing:
Doublet Separation for Photoelectron Lines

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au, Na1s-2p=1041.1
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

An error has occurred. This application may no longer respond until reloaded. Reload 🗙