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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
zinc selenide
chalcogenide, II-VI semiconductor, selenide

Citation:
Langer D.W., Vesely C.J.
Phys. Rev. B 2, 4885
Pub Year:
1970

Data Processing:
Separation from the Strongest Auger Line
SA-L2M23M45(1F)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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