NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

germanium

7440-56-4

element, II-VI semiconductor, IV semiconductor, IV-VI semiconductor

Citation:

Author Name(s):

McGilp, J. F., Weightman, P.

Journal:

J. Phys. C. 9, 3541

DOI:

Pub Year:

1977

bookAll Records in this Publication

Data Processing:

Data Type:

Separation from the Strongest Auger Line

Line Designation:

SA-L₂M₄₅M₄₅(¹G)

Separation Energy (eV)

31.00

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Onset of secondary emission, FL

Charge Reference:

Energy Scale Evaluation:

Calibration study

Comment:

On = onset of secondary emission

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):