NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Na₂SiF₆

Name:

sodium hexafluorosilicate(IV)

CAS Registry No:

Class:

alkali, fluoride, silicate

Citation:

Author Name(s):

Wagner C.D.

Journal:

Chapter 7 In 'Handbook of X-Ray and Ultraviolet Photoelectron Spectroscopy', D. Briggs, Editor

DOI:

Pub Year:

1977

book All Records in this Publication

Data Processing:

Auger Parameter

AP-1s, KL₂₃L₂₃(¹D)

1339.00

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu

Charge Reference:

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):