NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

SiO₂,quartz

Name:

silicon(IV) dioxide (Quartz)

CAS Registry No:

60676-86-0

Class:

glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:

Author Name(s):

Castle J.E., West R.H.

Journal:

J. Electron Spectrosc. Relat. Phenom. 18, 355

DOI:

Pub Year:

1980

bookAll Records in this Publication

Data Processing:

Auger Parameter

AP-2p, KL₂₃L₂₃(¹D)

1712.20

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Si A2p-K=1716.0

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):