NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

SiO₂,quartz

Name:

silicon(IV) dioxide (Quartz)

CAS Registry No:

60676-86-0

Class:

glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:

Author Name(s):

Klasson M., Berndtsson A., Hedman J., Nilsson R., Nyholm R., Nordling C.

Journal:

J. Electron Spectrosc. Relat. Phenom. 3, 427

DOI:

Pub Year:

1974

book All Records in this Publication

Data Processing:

Auger Parameter

AP-2p, KL₂₃L₂₃(¹D)

1712.20

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

CrK,Au3d5-4f7=2122.9

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):