There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
silicon
element, II-VI semiconductor, IV semiconductor

Citation:
Wagner C.D., Passoja D.E., Hillery H.F., Kinisky T.G., Six H.A., Jansen W.T., Taylor J.A.
J. Vac. Sci. Technol. 21, 933
Pub Year:
1982

Data Processing:
Auger Parameter
AP-2p, KL23L23(1D)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

An error has occurred. This application may no longer respond until reloaded. Reload 🗙