NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Cu₂S

copper(I) sulfide

22205-45-4

chalcogenide, IV-VI semiconductor, mineral, sulfide

Citation:

Author Name(s):

Wagner C.D.

Journal:

Discuss. Faraday Soc. 60, 291

DOI:

Pub Year:

1975

bookAll Records in this Publication

Data Processing:

Data Type:

Auger Parameter

Line Designation:

AP-2p_3/2, L₃M₄₅M₄₅(¹G)

Auger Parameter (eV)

1849.90

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu

Charge Reference:

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):