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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
zinc selenide
chalcogenide, II-VI semiconductor, selenide

Citation:
Fiermans, L., Hoogewijs, R., Vennik, J.
Surf. Sci. 47, 1
Pub Year:
1975

Data Processing:
Auger Parameter
AP-2p3/2, L3M45M45(1G)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Zn2p3-3d=1011.7
Charge Reference:
Energy Scale Evaluation:
One-point correction of energy scale
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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