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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
SiO2,quartz
silicon(IV) dioxide (Quartz)
60676-86-0
glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:
Riviere J.C., Crossley J.A.A.
Surf. Interface Anal. 8, 173
Pub Year:
1986

Data Processing:
Auger Parameter
AP-2s, KL23L23(1D)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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