NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

In

In₂S₃

indium(III) sulfide

CAS Registry No:

12030-24-9

chalcogenide, III-V semiconductor, sulfide

Citation:

Author Name(s):

Kazmerski L.L., Ireland P.J. . Sheldon P., Chu T.L., Chu S.S., Lin C.L.J.

J. Vac. Sci. Technol. 17, 1061

Pub Year:

1980

keyboard_arrow_downbookAll Records in this Publication

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 3

Data Processing:

Auger Parameter

Line Designation:

AP-3d_5/2, M₄N₄₅N₄₅

Auger Parameter (eV)

853.30

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

An error has occurred. This application may no longer respond until reloaded. Reload 🗙