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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
In
Formula:
In2S3
Name:
indium(III) sulfide
CAS Registry No:
12030-24-9
Class:
chalcogenide, III-V semiconductor, sulfide

Citation:
Author Name(s):
Kazmerski L.L., Ireland P.J. . Sheldon P., Chu T.L., Chu S.S., Lin C.L.J.
Journal:
J. Vac. Sci. Technol. 17, 1061
DOI:
Pub Year:
1980

Data Processing:
Data Type:
Auger Parameter
Line Designation:
AP-3d5/2, M4N45N45
Auger Parameter (eV)
853.30
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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