NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Pd

Pd₂Si

palladium silicon imc

CAS Registry No:

intermetallic, silicide

Citation:

Author Name(s):

Cors A., Pollak R.A., Tu K.N.

Thin Solid Films 104, 221

Pub Year:

1983

bookAll Records in this Publication

Data Processing:

Chemical Shift

Line Designation:

CS-3d_5/2

Chemical Shift (eV)

1.55

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Pd3d5=335.2

Charge Reference:

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

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