NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Pd

Pd₈₁Si₁₉

palladium silicon alloy(81-19)

CAS Registry No:

alloy

Citation:

Author Name(s):

Riley J.D., Ley L., Azouley J., Terahura K.

Phys. Rev. B 20, 776

Pub Year:

1979

bookAll Records in this Publication

Data Processing:

Chemical Shift

Line Designation:

CS-AP-3d_5/2,M5N45N45

Chemical Shift (eV)

-0.55

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

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