NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Na₂S₄O₆

XPS Formula:

Na₂S₂^-S*₂O₆ (bridging sulfur)

Name:

sodium tetrathionate

CAS Registry No:

10101-86-7

Class:

alkali

Citation:

Author Name(s):

Abraham K.M., Chaudri S.M.

Journal:

J. Electrochem. Soc. 133, 1307

DOI:

Pub Year:

1986

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

163.80

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300