NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

(In,Ga)AsOx

(In,Ga)As

indium gallium arsenic oxides

CAS Registry No:

106070-25-1

Class:

arsenide, III-V semiconductor, non-stoichiometric oxide

Citation:

Author Name(s):

Thomas III J.H., Kaganowicz G., Robinson J.W.

Journal:

J. Electrochem. Soc. 135, 1201

DOI:

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

17.30

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

InGaAs native oxide.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300