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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Si
Formula:
Si/Y
Name:
silicon/yttrium
CAS Registry No:
7440-21-3
Class:
element, IV semiconductor, rare earth

Citation:
Author Name(s):
Pellissier A., Baptist R., Chauvet G.
Journal:
Surf. Sci. 210, 99
DOI:
Pub Year:
1989

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV)
99.50
Energy Uncertainty:
0.1
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
0.2 ML and 3.0 ML Y/Si(111)-(7x7). Principal peak whose binding energy is constant with yttrium coverage. But from coverage between 2.3 and 3.0 ML the Si2p presents a shoulder located at 1.4 eV lower binding energy. Si(111)-c(7x7) was n-type P-doped with

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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