NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

[(C₂H₅)₂AlNH₂]₃

[(C₂H₅)₂Al*NH₂]₃

tris(mu-amido)hexaethyltrialuminum

CAS Registry No:

Class:

organometallic

Citation:

Author Name(s):

Boyd D.C., Haasch R.T., Mantell D.R., Schulze R.K., Evans J.F., and Gladfelter W.L.

Journal:

Chem. Mater. 1, 119

DOI:

Pub Year:

1989

bookAll Records in this Publication

Data Processing:

Photoelectron Line

75.80

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Spectra of the materials were obtained by dosing these materials onto a sample of sputter cleaned gold foil at 773 K in the spectrometer.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300