NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Ag/SnO₂

silver/tin dioxide

7440-22-4

IV semiconductor

Citation:

Author Name(s):

Matsushima S., Teraoka Y., Miura N., Yamazoe N.

Journal:

Jpn. J. Appl. Phys. Part 1 27, 1798

DOI:

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

367.60

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Gold

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Ag(1.5 % wt)/SnO2.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300