There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Pd
Formula:
Pd/SnO2
Name:
palladium/tin dioxide
CAS Registry No:
7440-05-3
Class:
IV semiconductor

Citation:
Author Name(s):
Matsushima S., Teraoka Y., Miura N., Yamazoe N.
Journal:
Jpn. J. Appl. Phys. Part 1 27, 1798
DOI:
Pub Year:
1988

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3d5/2
Binding Energy (eV)
337.00
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Gold
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Pd(10.0 % wt)/SnO2. To prepare Pd/SnO2 samples, the SnO2 powder was impregnated with an aqueous solution of PdCl2, followed by evaporation to dryness and calcination in air at 873 K for 5h. The PdCl2- impregnated samples were subjected to reduction in a f

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
An error has occurred. This application may no longer respond until reloaded. Reload 🗙