NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

InSb

indium stibnide

1312-41-0

II-VI semiconductor, III-V semiconductor, intermetallic, stibnide

Citation:

Author Name(s):

Hinkel V., Sorba L., Horn K.

Journal:

Surf. Sci. 194, 597

DOI:

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-4d_5/2

Surface Core-Level Shift (eV)

0.24

Energy Uncertainty:

0.02

Background Subtraction Method:

other

Peak Location Method:

Lorentzian

Full Width at Half-maximum Intensity (eV):

0.13

Gaussian Width (eV):

0.66

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

35-75

Overall Energy Resolution (eV):

0.28

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

n-type InSb(110)-(1x1).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300