NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C₁₅Se₈₅

carbon selenium

chalcogenide

Citation:

Author Name(s):

Prasad R.N., Abhyankar N., Kulkarni S.K., Karekar R.N.

Journal:

Solid State Ionics 42, 37

DOI:

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

55.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.75

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Se and C are mixed in the ratio 4:1 and pressed at 400 MPa to get pellets.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300