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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Er/Si
Bulk silicon
erbium/silicon
cluster, element, IV semiconductor, silicide

Citation:
Gokhale S., Mahamuni S., Deshmukh S.V., Rao V.J., Nigavekar A.S., and Kulkarni S.K.
Surf. Sci. 237, 127
Pub Year:
1990

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
1,2,5,10,15,40 A Er/Si(111), p-type. The rate of evaporation was monitored by a quartz crystal microbalance and was about 1A/min.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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