NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Er/Si

bulk silicon

erbium/silicon

7440-21-3

cluster, element, IV semiconductor, silicide

Citation:

Author Name(s):

Gokhale S., Mahamuni S., Deshmukh S.V., Rao V.J., Nigavekar A.S., and Kulkarni S.K.

Journal:

Surf. Sci. 237, 127

DOI:

Pub Year:

1990

book All Records in this Publication

Data Processing:

Photoelectron Line

99.30

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

200 A Er/Si(111), p-type. The rate of evaporation was monitored by a quartz crystal microbalance and was about 1A/min.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

473